31/Mar/2020 | 90119000 | Q310-171637 ION GALIUM ION SOURCE PARTS OF FIB ELECTRONIC MICROSCOPES (16830, F / G, LMI, GA69, CA, LONGLIFE). NEW 100% | United States of America | piece/pcs | 1.00 | 3,119.22 | 3,119.22 | View Importer | View Supplier |
19/Mar/2020 | 90119000 | Q310-472794 EXTRACTION, USED TO CHANGE THE WIDE SPACES OF THE PLASMA FIB MACHINE (APERTURE STRIP, BAA 1035392). NEW 100% | United States of America | piece/pcs | 1.00 | 1,903.57 | 1,903.57 | View Importer | View Supplier |
31/Jan/2019 | 90119000 | Q310-171637 ION GALIUM ION SOURCE SECTION OF ELECTRONIC MICROSCOPES (16830 , F / G , LMI , GA69 , CA , LONGLIFE). NEW 100% | United States of America | Piece/Pcs | 2.00 | 6,214.28 | 3,107.14 | View Importer | View Supplier |
31/Jan/2019 | 90119000 | Q310-171637 ION GALIUM ION SOURCE SECTION OF ELECTRONIC MICROSCOPES (16830 , F / G , LMI , GA69 , CA , LONGLIFE). NEW 100% | United States of America | Piece/Pcs | 2.00 | 6,214.28 | 3,107.14 | View Importer | View Supplier |
14/Jan/2019 | 90119000 | Q310-171637 ION GALIUM ION SOURCE SECTION OF ELECTRONIC MICROSCOPES (16830 , F / G , LMI , GA69 , CA , LONGLIFE). NEW 100% | United States of America | Piece/Pcs | 2.00 | 6,238.44 | 3,119.22 | View Importer | View Supplier |