| 31/Mar/2020 | 90119000 | Q310-171637 ION GALIUM ION SOURCE PARTS OF FIB ELECTRONIC MICROSCOPES (16830, F / G, LMI, GA69, CA, LONGLIFE). NEW 100% | United States of America | piece/pcs | 1.00 | 3,119.22 | 3,119.22 | View Importer | View Supplier |
| 27/Mar/2020 | 90119000 | IIB GALIUM POWER SINGLE PARTS OF ELECTRONIC MICROSCOPES (16830, F / G, LMI, GA69, CA, LONGLIFE). NEW 100% | United States of America | piece/pcs | 1.00 | 2,933.42 | 2,933.42 | View Importer | View Supplier |
| 26/Mar/2020 | 90119000 | - # & 10X Eyepiece for electronic component microscopes, model: WF10X / 20, Magnification: 10X. 100% new items | China | piece/pcs | 33.00 | 820.23 | 24.86 | View Importer | View Supplier |
| 24/Mar/2020 | 90118000 | DIGITAL MICROSCORP # & Electron Microscopes for checking circuit board voltage: AC 100 - 240V50 / 60Hz, Manufacturer KEYENCE. New 100% | Japan | set | 1.00 | 61,018.61 | 61,018.61 | View Importer | View Supplier |
| 23/Mar/2020 | 90112000 | Microscopes are used to check the appearance of electronic components. Brand ZHUOYE, model 10A, voltage 5 / 12V. 45X resolution, Products manufactured in 2019 | China | piece/pcs | 12.00 | 1,200.00 | 100.00 | View Importer | View Supplier |
| 20/Mar/2020 | 90303100 | Analytical flow gauges of scanning electron microscopes, excluding recording equipment, 100% new, Carl Zeiss sx, product code: 000000-0113-778 | United Kingdom | piece/pcs | 1.00 | 2,151.41 | 2,151.41 | View Importer | View Supplier |
| 13/Mar/2020 | 90029090 | Graduated glass for calibration of electron microscopes, optically processed, MODEL OP-87426, Keyence, 100% new | Japan | piece/pcs | 1.00 | 616.51 | 616.51 | View Importer | View Supplier |
| 13/Mar/2020 | 90121000 | Electronic microscope set, NSX: JEOL, model: JCM-7000, series: MP1240002030203; 1 set of microscopes and power supplies, used in the laboratory to analyze the structure and composition of materials. 100% new | Japan | set | 1.00 | 145,047.70 | 145,047.70 | View Importer | View Supplier |
| 05/Mar/2020 | 90279099 | Diamond microsurgical scalpel (Histo 4.0mm, code DH4540, Accessories for microsurgical cutting device, used to cut soft material samples for electron microscopes). New 100% | Switzerland | piece/pcs | 2.00 | 1,957.24 | 978.62 | View Importer | View Supplier |
| 04/Mar/2020 | 90111000 | # & Electronic microscopes, used to stereoscopic surface of electronic components, Model: BHDC-307, S / N: IBVM-3010105,12v / 1A, NSX: ISM TECH, DATE: 2020. 100% new | Korea (Republic) | piece/pcs | 1.00 | 505.44 | 505.44 | View Importer | View Supplier |
| 04/Mar/2020 | 90111000 | # & Electronic microscopes, used to stereoscopic surface of electronic components, Model: BHDC-307, S / N: IBVM-3010109,12v / 1A, NSX: ISM TECH, DATE: 2020. new 100% | Korea (Republic) | piece/pcs | 1.00 | 505.44 | 505.44 | View Importer | View Supplier |
| 02/Mar/2020 | 90129000 | 3 # & electron beam transmitter, code: 51E-0240, 10 pcs / set (accessories for electron microscopes). HITACHI brand, brand new 100% | Japan | set | 1.00 | 797.15 | 797.15 | View Importer | View Supplier |
| 31/Jan/2019 | 90119000 | Q310-171637 ION GALIUM ION SOURCE SECTION OF ELECTRONIC MICROSCOPES (16830 , F / G , LMI , GA69 , CA , LONGLIFE). NEW 100% | United States of America | Piece/Pcs | 2.00 | 6,214.28 | 3,107.14 | View Importer | View Supplier |
| 31/Jan/2019 | 90119000 | Q270-017515 ION SOURCE ADJUSTMENT ACCESSORIES IN ACCORDANCE WITH FIB ELECTRONIC MICROSCOPES (4035 273 12631). NEW 100% | United States of America | Piece/Pcs | 2.00 | 7,035.12 | 3,517.56 | View Importer | View Supplier |
| 31/Jan/2019 | 90119000 | Q310-171637 ION GALIUM ION SOURCE SECTION OF ELECTRONIC MICROSCOPES (16830 , F / G , LMI , GA69 , CA , LONGLIFE). NEW 100% | United States of America | Piece/Pcs | 2.00 | 6,214.28 | 3,107.14 | View Importer | View Supplier |
